Physical understanding of trends in current collapse with atomic layer deposited dielectrics in AlGaN/GaN MOS heterojunction FETs

Document Details

Document Type: Pub Defense Publication
Publication Date: Feb 15, 2016
Source ID: 10.1088/0268-1242/31/3/035016

Entities

People

Bongmook Lee
Narayanan Ramanan
Veena Misra

Organizations

National Science Foundation
Office of Naval Research