High-resolution high-sensitivity elemental imaging by secondary ion mass spectrometry: from traditional 2D and 3D imaging to correlative microscopy

Document Details

Document Type
Pub Defense Publication
Publication Date
Oct 05, 2015
Source ID
10.1088/0957-4484/26/43/434001

Entities

People

  • D Dowsett
  • J-n Audinot
  • P Philipp
  • S Eswara
  • T Wirtz

Organizations

  • Intelligence Advanced Research Projects Activity
  • National Research Fund Luxembourg