Versatile technique for assessing thickness of 2D layered materials by XPS

Document Details

Document Type
Pub Defense Publication
Publication Date
Feb 07, 2018
Source ID
10.1088/1361-6528/aaa6ef

Entities

People

  • Andrey A. Voevodin
  • Anurag Kumar
  • David Saenz
  • Dmitry N Zakharov
  • Dmitry Y. Zemlyanov
  • Jianjun Hu
  • Kyle C Smith
  • Michael Jespersen
  • Nicholas R Glavin
  • Rajib Paul
  • Shanee Pacley
  • Timothy S. Fisher

Organizations

  • Air Force Research Laboratory