X-ray diffraction study of strain relaxation, spontaneous compositional gradient, and dislocation density in GeSn/Ge/Si(100) heterostructures

Document Details

Document Type
Pub Defense Publication
Publication Date
Jun 10, 2020
Source ID
10.1088/1361-6641/ab883c

Entities

People

  • Andrian V Kuchuk
  • Gregory J. Salamo
  • Hryhorii V Stanchu
  • Jake Richter
  • Joe Margetis
  • John Tolle
  • Shui-Qing Yu
  • Yuriy I. Mazur

Organizations

  • Air Force Office of Scientific Research