From randomized benchmarking experiments to gate-set circuit fidelity: how to interpret randomized benchmarking decay parameters

Document Details

Document Type
Pub Defense Publication
Publication Date
Sep 05, 2018
Source ID
10.1088/1367-2630/aadcc7

Entities

People

  • Arnaud Carignan-Dugas
  • Joel J Wallman
  • Joseph Emerson
  • Kristine Boone

Organizations

  • Army Research Office
  • Canada First Research Excellence Fund
  • Canadian Institute for Advanced Research
  • Innovation, Science and Economic Development Canada
  • Natural Sciences and Engineering Research Council