Measurement of mean inner potential and inelastic mean free path of ZnO nanowires and nanosheet

Document Details

Document Type: Pub Defense Publication
Publication Date: Oct 02, 2015
Source ID: 10.1088/2053-1591/2/10/105003

Entities

People

David J Smith
Hongbin Yu
Martha R. Mccartney
Seungho Ahn
Zhaofeng Gan

Organizations

ARPA-E
Army Research Office