Measurement of the Kerr Nonlinear Refractive Index and its Variation Among 4H - SiC Wafers

Document Details

Document Type
Pub Defense Publication
Publication Date
Mar 24, 2023
Source ID
10.1103/physrevapplied.19.034083

Entities

People

  • Jingwei Li
  • Lutong Cai
  • Qing Li
  • Ruixuan Wang

Organizations

  • Defense Advanced Research Projects Agency
  • National Science Foundation