Using Atom-Probe Tomography to UnderstandZnO∶Al/SiO2/SiSchottky Diodes

Document Details

Document Type
Pub Defense Publication
Publication Date
Sep 26, 2016
Source ID
10.1103/physrevapplied.6.034016

Entities

People

  • Amanda Youssef
  • Austin J. Akey
  • Frank Schoofs
  • R Jaramillo
  • Shriram Ramanathan
  • Tonio Buonassisi

Organizations

  • Air Force Office of Scientific Research
  • National Science Foundation
  • United States Department of Energy