Strain relaxation induced transverse resistivity anomalies in SrRuO3 thin films

Document Details

Document Type
Pub Defense Publication
Publication Date
Aug 07, 2020
Source ID
10.1103/physrevb.102.064406

Entities

People

  • Berit H. Goodge
  • Boris Tsang
  • Cyrus Zeledon
  • Darrell G. Schlom
  • Hari P. Nair
  • J P Ruf
  • Jie Shan
  • Kin Fai Mak
  • Kyle. M. Shen
  • Lena F Kourkoutis
  • Ludi Miao
  • Matthew Fu
  • Nathaniel J. Schreiber
  • Shengwei Jiang
  • Yingfei Li
  • Yonghun Lee

Organizations

  • Air Force Office of Scientific Research
  • Gordon and Betty Moore Foundation
  • National Science Foundation
  • United States Department of Energy