Scanning ultrafast electron microscopy reveals photovoltage dynamics at a deeply buried p−Si/SiO2 interface

Document Details

Document Type
Pub Defense Publication
Publication Date
Oct 26, 2021
Source ID
10.1103/physrevb.104.l161303

Entities

People

  • Albert Alec Talin
  • Bolin Liao
  • D. W. Chandler
  • David Russell Hughart
  • Diana R. Garland
  • Elliot J. Fuller
  • F. Leonard
  • Joseph R. Michael
  • K. C. Celio
  • Matthew Marinella
  • N. C. Bartelt
  • Scott R Ellis

Organizations

  • Army Research Office
  • National Nuclear Security Administration
  • National Science Foundation
  • United States Department of Energy

Tags

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene