Metrology of band topology via resonant inelastic x-ray scattering

Document Details

Document Type
Pub Defense Publication
Publication Date
Jan 20, 2023
Source ID
10.1103/physrevb.107.045129

Entities

People

  • B. J. Kim
  • Byungmin Kang
  • Gil Young Cho
  • Kyung-Hwan Jin
  • Sangjin Lee

Organizations

  • Air Force Office of Scientific Research
  • National Research Foundation of Korea
  • Samsung Science and Technology Foundation (South Korea)