Ion irradiation of the native oxide/silicon surface increases the thermal boundary conductance across aluminum/silicon interfaces

Document Details

Document Type
Pub Defense Publication
Publication Date
Jul 03, 2014
Source ID
10.1103/physrevb.90.024301

Entities

People

  • Caroline S. Gorham
  • Douglas L. Medlin
  • Edward S. Piekos
  • John C. Duda
  • John T. Gaskins
  • Jon F. Ihlefeld
  • Khalid Hattar
  • Laura B. Biedermann
  • Patrick E Hopkins
  • Ramez Cheaito
  • Thomas E. Beechem

Organizations

  • Army Research Office
  • Office of Naval Research
  • United States Department of Energy