Detecting edge degeneracy in interacting topological insulators through entanglement entropy

Document Details

Document Type
Pub Defense Publication
Publication Date
Mar 10, 2015
Source ID
10.1103/physrevb.91.115118

Entities

People

  • Congjun Wu
  • Da Wang
  • Shenglong Xu
  • Yu Wang

Organizations

  • Air Force Office of Scientific Research
  • National Natural Science Foundation of China
  • National Science Foundation

Tags

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene