Quantifying electronic correlation strength in a complex oxide: A combined DMFT and ARPES study ofLaNiO3

Document Details

Document Type
Pub Defense Publication
Publication Date
Dec 07, 2015
Source ID
10.1103/physrevb.92.245109

Entities

People

  • A. J. Millis
  • D. G. Schlom
  • Elizabeth Nowadnick
  • Heonjoon Park
  • J P Ruf
  • K. M. Shen
  • Philip D. C. King

Organizations

  • Argonne National Laboratory
  • National Science Foundation
  • Office of Naval Research
  • United States Department of Energy
  • University of Illinois at Chicago

Tags

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene