Quantum metrology with a single spin- 32 defect in silicon carbide
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Feb 13, 2017
- Source ID
- 10.1103/physrevb.95.081405
Entities
People
- T. L. Reinecke
- Ö. O. Soykal
Organizations
- National Academy of Sciences
- Office of Naval Research