Origin of the current-driven breakdown in vanadium oxides: Thermal versus electronic
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Nov 30, 2018
- Source ID
- 10.1103/physrevb.98.195144
Entities
People
- I. Valmianski
- Ivan K. Schuller
- Juan Gabriel Ramírez
- Paul Y. Wang
- Shuo Wang
- Stefan Guénon
Organizations
- Office of Naval Research
- University of the Andes