Electronic Origin of Ultrafast Photoinduced Strain inBiFeO3

Document Details

Document Type
Pub Defense Publication
Publication Date
Jan 18, 2013
Source ID
10.1103/physrevlett.110.037601

Entities

People

  • Carolina Adamo
  • Darrell G. Schlom
  • Donald A. Walko
  • Eric M. Dufresne
  • Haidan Wen
  • John W Freeland
  • Jon F. Ihlefeld
  • June Hyuk Lee
  • Margaret P. Cosgriff
  • Paul G. Evans
  • Pice Chen
  • Richard D. Schaller
  • Yuelin Li

Organizations

  • Army Research Office
  • United States Department of Energy

Tags

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene