Decoupling Carrier Concentration and Electron-Phonon Coupling in Oxide Heterostructures Observed with Resonant Inelastic X-Ray Scattering

Document Details

Document Type
Pub Defense Publication
Publication Date
Dec 07, 2018
Source ID
10.1103/physrevlett.121.236802

Entities

People

  • D Meyers
  • D. Haskel
  • D. Mcnally
  • E. Arenholz
  • E. Karapetrova
  • E. Paris
  • G. Fabbris
  • Jian Liu
  • Jonathan Pelliciari
  • Junyi Yang
  • Ken Nakatsukasa
  • Lin Hao
  • M. Dantz
  • M. P. M. Dean
  • Miao Hu
  • P. Shafer
  • Sai Mu
  • Simon Johnston
  • Thorsten Schmitt
  • Tom Berlijn
  • Yongseong Choi
  • Yue Cao

Organizations

  • Swiss National Science Foundation
  • United States Department of Defense
  • United States Department of Energy
  • University of Tennessee

Tags

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene