Thickness and strain dependence of piezoelectric coefficient in BaTiO3 thin films

Document Details

Document Type
Pub Defense Publication
Publication Date
Feb 12, 2020
Source ID
10.1103/physrevmaterials.4.024407

Entities

People

  • A. C. T. Van Duin
  • D. E. Yilmaz
  • Dooman Akbarian
  • H. N. Lee
  • K. P. Kelley
  • L. Collins
  • Prashant Ganesh
  • Rama K. Vasudevan
  • Yogesh Sharma

Organizations

  • Air Force Office of Scientific Research
  • Air Force Research Laboratory
  • United States Department of Energy