Origin of the Magnetoresistance in Oxide Tunnel Junctions Determined through Electric Polarization Control of the Interface

Document Details

Document Type
Pub Defense Publication
Publication Date
Nov 11, 2015
Source ID
10.1103/physrevx.5.041023

Entities

People

  • Adrian G. Swartz
  • Harold Y. Hwang
  • Hisashi Inoue
  • Michael E. Flatté
  • Nicholas J. Harmon
  • Takashi Tachikawa
  • Yasuyuki Hikita

Organizations

  • Defense Advanced Research Projects Agency
  • United States Department of Energy