An Investigation of Frequency Dependent Reliability and Failure Mechanism of pGaN Gated GaN HEMTs

Document Details

Document Type
Pub Defense Publication
Publication Date
Jan 01, 2020
Source ID
10.1109/access.2020.3011453

Entities

People

  • Andrew J. Sellers
  • Cheikh A. Tine
  • Michael R. Hontz
  • Raghav Khanna
  • Roshan L. Kini
  • Sadab Mahmud
  • Shankar Dhakal

Organizations

  • Office of Naval Research