Thin-Film Transistor Simulations With the Voltage-In-Current Latency Insertion Method

Document Details

Document Type
Pub Defense Publication
Publication Date
Jan 01, 2021
Source ID
10.1109/access.2021.3131730

Entities

People

  • Andrei Pashkovich
  • José E. Schutt-ainé
  • Nur Syazreen Ahmad
  • Patrick Goh
  • Wei Chun Chin

Organizations

  • Ministry of Higher Education
  • United States Army