Movement of Current Filaments and its Impact on Avalanche Robustness in Vertical GaN P-N diode Under UIS stress

Document Details

Document Type
Pub Defense Publication
Publication Date
Jun 26, 2022
Source ID
10.1109/drc55272.2022.9855818

Entities

People

  • Andrew Binder
  • Bhawani Shankar
  • Brendan Gunning
  • Chuanzhe Meng
  • Jack Flicker
  • Jeramy Ray Dickerson
  • Ke Zeng
  • Rafael Perez Martinez
  • Robert Kaplar
  • Srabanti Chowdhury

Organizations

  • ARPA-E
  • Office of Naval Research
  • Sandia National Laboratories
  • Stanford University