Prognostication of Accrued Damage and Impending Failure Under Temperature-Vibration in Leadfree Electronics

Document Details

Document Type
Pub Defense Publication
Publication Date
May 01, 2019
Source ID
10.1109/ectc.2019.00083

Entities

People

  • Anthony William Thomas
  • Jeff Suhling
  • Ken Blecker
  • Pradeep Lall

Tags

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems