Reliability Considerations for Wafer Scale Systems

Document Details

Document Type
Pub Defense Publication
Publication Date
Jun 01, 2021
Source ID
10.1109/ectc32696.2021.00025

Entities

People

  • Haoxiang Ren
  • Niloofar Shakoorzadeh Chase
  • Randall Irwin
  • Subramanian Iyer
  • Yu Tao Yang

Organizations

  • Defense Advanced Research Projects Agency
  • Semiconductor Research Corporation
  • University of California Office of the President