Degradation Behaviors in InAs Quantum Dot Lasers on Silicon using Misfit Dislocation Trapping Layers
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Oct 01, 2021
- Source ID
- 10.1109/ipc48725.2021.9593088
Entities
People
- Chen Shang
- Eamonn T Hughes
- Jennifer Selvidge
- John E. Bowers
- Kunal Mukherjee
- Robert W. Herrick
Organizations
- Defense Advanced Research Projects Agency
- United States Department of Defense