Bias Temperature Instability on SiC n- and p-MOSFETs for High Temperature CMOS Applications

Document Details

Document Type
Pub Defense Publication
Publication Date
Mar 01, 2022
Source ID
10.1109/irps48227.2022.9764565

Entities

People

  • Adam J. Morgan
  • Anant K. Agarwal
  • Ayman Fayed
  • Bongmook Lee
  • Emran K Ashik
  • Hua Zhang
  • Sundar Babu Isukapati
  • Tianshi Liu
  • Utsav Gupta
  • Veena Misra
  • Woongje Sung

Organizations

  • Defense Advanced Research Projects Agency
  • North Carolina State University
  • Ohio State University
  • State University of New York