The Importance of Patch Fields in Accurately Modeling Miram Curves

Document Details

Document Type
Pub Defense Publication
Publication Date
Apr 27, 2021
Source ID
10.1109/ivec51707.2021.9722389

Entities

People

  • Dane Morgan
  • Dongzheng Chen
  • John H. Booske
  • Ryan Jacobs

Organizations

  • Defense Advanced Research Projects Agency
  • University of Wisconsin–Madison