The Impact of Channel Semiconductor on the Memory Characteristics of Ferroelectric Field-Effect Transistors
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Jan 01, 2020
- Source ID
- 10.1109/jeds.2020.3012901
Entities
People
- Jinhyun Noh
- Junkang Li
- Mengwei Si
- Peide Ye
- Wonil Chung
- Zehao Lin
Organizations
- Air Force Office of Scientific Research