On the Critical Role of Ferroelectric Thickness for Negative Capacitance Device-Circuit Interaction

Document Details

Document Type: Pub Defense Publication
Publication Date: Jan 01, 2021
Source ID: 10.1109/jeds.2021.3110486

Entities

People

Aniket Gupta
Girish Pahwa
Hussam Amrouch
Om Prakash
Yogesh Singh Chauhan

Organizations

Office of Naval Research