Cross-Layer Noise Analysis in Smart Digital Pixel Sensors With Integrated Deep Neural Network

Document Details

Document Type
Pub Defense Publication
Publication Date
Dec 01, 2020
Source ID
10.1109/jetcas.2020.3031869

Entities

People

  • Edward Lee
  • Mandovi Mukherjee
  • Minah Lee
  • Mohammad Faisal Amir
  • Priyabrata Saha
  • Saibal Mukhopadhyay
  • Taesik Na

Organizations

  • Defense Advanced Research Projects Agency

Tags

Technology Areas

  • AI & ML
  • AI & ML - Neural Networks