Evolution of LeTID Defects in p-Type Multicrystalline Silicon During Degradation and Regeneration

Document Details

Document Type
Pub Defense Publication
Publication Date
Jul 01, 2017
Source ID
10.1109/jphotov.2017.2695496

Entities

People

  • Ashley E Morishige
  • David Berney Needleman
  • Jasmin Hofstetter
  • Mallory A. Jensen
  • Tonio Buonassisi

Organizations

  • Division of Electrical, Communications & Cyber Systems
  • Harvard University
  • National Science Foundation
  • United States Department of Defense
  • United States Department of Energy