Effect of Reduced Extended Defect Density in MOCVD Grown AlGaN/GaN HEMTs on Native GaN Substrates
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Jan 01, 2016
- Source ID
- 10.1109/led.2015.2502221
Entities
People
- Andrew D. Koehler
- Fritz J. Kub
- Jennifer K Hite
- Jordan D. Greenlee
- Karl D. Hobart
- Marko J. Tadjer
- Travis J. Anderson
Organizations
- National Research Council
- Office of Naval Research