Impact of Parasitic Capacitance and Ferroelectric Parameters on Negative Capacitance FinFET Characteristics

Document Details

Document Type
Pub Defense Publication
Publication Date
Jan 01, 2017
Source ID
10.1109/led.2016.2628349

Entities

People

  • Asif Islam Khan
  • Chenming Hu
  • Juan Pablo Duarte
  • Sayeef Salahuddin
  • Sourabh Khandelwal