High-Performance Depletion/Enhancement-ode $\beta$ -Ga2O3 on Insulator (GOOI) Field-Effect Transistors With Record Drain Currents of 600/450 mA/mm

Document Details

Document Type
Pub Defense Publication
Publication Date
Jan 01, 2017
Source ID
10.1109/led.2016.2635579

Entities

People

  • Gang Qiu
  • Hong Zhou
  • Lingming Yang
  • Mengwei Si
  • Peide Ye
  • Sami Alghamdi

Organizations

  • Air Force Office of Scientific Research
  • Defense Threat Reduction Agency

Tags

Technology Areas

  • Microelectronics