Photoconductance Decay Characterization of 3D Multi-Fin Silicon on SOI Substrates

Document Details

Document Type
Pub Defense Publication
Publication Date
Nov 01, 2017
Source ID
10.1109/led.2017.2749205

Entities

People

  • A. M. Diehm
  • A. Wali
  • J. Ruzyllo
  • Michael Barth
  • Patrick Drummond
  • Supriyo Datta

Organizations

  • Defense Threat Reduction Agency