Improved Hysteresis and Reliability of MoS2Transistors With High-Quality CVD Growth and Al2O3Encapsulation

Document Details

Document Type
Pub Defense Publication
Publication Date
Dec 01, 2017
Source ID
10.1109/led.2017.2768602

Entities

People

  • Eric Pop
  • Kirby K H Smithe
  • Michael Waltl
  • Theresia Knobloch
  • Tibor Grasser
  • Yury Yu Illarionov

Organizations

  • Air Force Office of Scientific Research
  • Austrian Science Fund
  • National Science Foundation