Trapping Effects in Si -Doped -Ga2O3 MESFETs on an Fe-Doped -Ga2O3 Substrate

Document Details

Document Type
Pub Defense Publication
Publication Date
Jul 01, 2018
Source ID
10.1109/led.2018.2843344

Entities

People

  • Aaron R. Arehart
  • Chandan Joishi
  • Joe F. McGlone
  • Saurabh Lodha
  • Siddharth Rajan
  • Steven A. Ringel
  • Yuewei Zhang
  • Zhanbo Xia

Organizations

  • Defense Threat Reduction Agency
  • National Science Foundation