Impact of Switching Variability, Memory Window, and Temperature on Vector Matrix Operations Using 65nm CMOS Integrated Hafnium Dioxide-based ReRAM Devices

Document Details

Document Type
Pub Defense Publication
Publication Date
May 23, 2022
Source ID
10.1109/mdts54894.2022.9826924

Entities

People

  • Karsten Beckmann
  • Maximilian Liehr
  • Nathaniel C Cady

Organizations

  • Air Force Research Laboratory
  • SUNY Polytechnic Institute