Experimental Characterization of Two-Photon Optical Beam Induced Current Imaging for Microelectronics Assurance

Document Details

Document Type
Pub Defense Publication
Publication Date
Oct 24, 2023
Source ID
10.1109/paine58317.2023.10317954

Entities

People

  • Adam Kimura
  • Anthony George
  • Jamin J. McCue
  • Ryan J. Patton

Organizations

  • Air Force Research Laboratory
  • Battelle Memorial Institute

Tags

Technology Areas

  • Microelectronics