A Robust Completed Local Binary Pattern (RCLBP) for Surface Defect Detection
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Oct 17, 2021
- Source ID
- 10.1109/smc52423.2021.9659140
Entities
People
- Abdollah Homaifar
- Abenezer Girma
- Daniel Opoku
- Mahmoud Nabil
- Nana Kankam Gyimah
- Shamila Nateghi
Organizations
- Air Force Research Laboratory
- Lockheed Martin