AC-Biased Shift Registers as Fabrication Process Benchmark Circuits and Flux Trapping Diagnostic Tool

Document Details

Document Type: Pub Defense Publication
Publication Date: Jun 01, 2017
Source ID: 10.1109/tasc.2017.2669585

Entities

People

Sergey K. Tolpygo
Yuri A. Polyakov
В.К. Семенов

Organizations

Intelligence Advanced Research Projects Activity
Office of the Director of National Intelligence