Diagnosis of Factors Impacting Yield in Multilayer Devices for Superconducting Electronics

Document Details

Document Type
Pub Defense Publication
Publication Date
Aug 01, 2019
Source ID
10.1109/tasc.2019.2908052

Entities

People

  • A.F. Kirichenko
  • Alex Wynn
  • Alexandra L. Day
  • Igor V. Vernik
  • Leonard M. Johnson
  • Mark W. Jenkins
  • Nancy A. Missert
  • Oleg A. Mukhanov
  • Pai Tangyunyong
  • Vladimir Bolkhovsky
  • William Mook

Organizations

  • Honeywell International, Inc.
  • Intelligence Advanced Research Projects Activity
  • Sandia National Laboratories

Tags

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene