Characterization of Uniformity in Nb/NbxSi1-x/Nb Josephson Junctions
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Dec 01, 2019
- Source ID
- 10.1109/tasc.2019.2922225
Entities
People
- Anna E Fox
- Eric R J Edwards
- Ian W Haygood
- Matthew R. Pufall
- Michael L Schneider
- Paul D Dresselhaus
- Samuel P Benz
- William H. Rippard
Organizations
- National Institute of Standards and Technology