An Effective and Efficient Automatic Test Pattern Generation (ATPG) Paradigm for Certifying Performance of RSFQ Circuits

Document Details

Document Type
Pub Defense Publication
Publication Date
Aug 01, 2020
Source ID
10.1109/tasc.2020.2965933

Entities

People

  • Fangzhou Wang
  • Sandeep K. Gupta

Organizations

  • Army Research Office
  • Intelligence Advanced Research Projects Activity
  • Office of the Director of National Intelligence