A Robust Asymmetric Kernel Function for Bayesian Optimization, With Application to Image Defect Detection in Manufacturing Systems

Document Details

Document Type
Pub Defense Publication
Publication Date
Oct 01, 2022
Source ID
10.1109/tase.2021.3114157

Entities

People

  • Areej AlBahar
  • Inyoung Kim
  • Xiaowei Yue

Organizations

  • United States Department of Defense
  • Virginia Tech

Tags

Technology Areas

  • AI & ML
  • AI & ML - Bayesian Inference
  • AI & ML - Machine Learning Algorithms