Accelerating Electromigration Aging: Fast Failure Detection for Nanometer ICs

Document Details

Document Type
Pub Defense Publication
Publication Date
Apr 01, 2020
Source ID
10.1109/tcad.2019.2907908

Entities

People

  • Sheldon X.-D. Tan
  • Sheriff Sadiqbatcha
  • Zeyu Sun

Organizations

  • Defense Advanced Research Projects Agency
  • National Science Foundation