High-Field Stress, Low-Frequency Noise, and Long-Term Reliability of AlGaN/GaN HEMTs

Document Details

Document Type
Pub Defense Publication
Publication Date
Sep 01, 2016
Source ID
10.1109/tdmr.2016.2581178

Entities

People

  • Aaron R. Arehart
  • Cathy Lee
  • Daniel M. Fleetwood
  • En Xia Zhang
  • Erin C. H. Kyle
  • James S. Speck
  • Jin Chen
  • P. Saunier
  • Ronald D. Schrimpf
  • Sokrates T. Pantelides
  • Stephen W. Kaun
  • Steven A. Ringel
  • Yevgeniy S. Puzyrev

Organizations

  • Defense Threat Reduction Agency
  • National Science Foundation
  • Office of Science