Effects of Negative-Bias-Temperature-Instability on Low-Frequency Noise in SiGe ${p}$ MOSFETs

Document Details

Document Type
Pub Defense Publication
Publication Date
Dec 01, 2016
Source ID
10.1109/tdmr.2016.2611533

Entities

People

  • Aaron Voon-yew Thean
  • Anda Mocuta
  • Cher Xuan Zhang
  • Daniel M. Fleetwood
  • Dimitri Linten
  • En Xia Zhang
  • Guo Xing Duan
  • Jerome Mitard
  • Jordan A Hachtel
  • Liesbeth Witters
  • Matthew F. Chisholm
  • Nadine Collaert
  • Robert A. Reed
  • Ronald D. Schrimpf
  • Sokrates T. Pantelides

Organizations

  • Air Force Office of Scientific Research
  • Defense Threat Reduction Agency
  • National Science Foundation
  • United States Department of Energy