Wafer-Level Electrically Detected Magnetic Resonance: Magnetic Resonance in a Probing Station

Document Details

Document Type
Pub Defense Publication
Publication Date
Jun 01, 2018
Source ID
10.1109/tdmr.2018.2817341

Entities

People

  • Duane J McCrory
  • Jason P Campbell
  • Jason T. Ryan
  • Kin P Cheung
  • Mark Anders
  • Patrick M. Lenahan
  • Pragya R. Shrestha

Organizations

  • Air Force Office of Scientific Research
  • National Institute of Standards and Technology
  • National Science Foundation
  • United States Army Research Laboratory